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AN54908 - Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates | 赛普拉斯半导体

AN54908 - Accelerated Neutron SER Testing and Calculation of Terrestrial Failure Rates

最近更新: 
2020 年 5 月 26 日
版本: 
*D

This application note describes the accelerated neutron testing procedure and test conditions that are applied during device qualification for Cypress SRAM devices. It covers Synchronous SRAM, Asynchronous SRAM, More Battery Life™ MoBL® SRAM, and Nonvolatile SRAM (nvSRAM) but does not contain soft error rate (SER) data for any of the SRAMs. Individual datasheets for Synchronous SRAMs list the derived accelerated neutron failure rates.

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