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AN96475 - Design Considerations for Electrical Fast Transient Immunity of a CapSense® System | 赛普拉斯半导体

AN96475 - Design Considerations for Electrical Fast Transient Immunity of a CapSense® System

最近更新: 
2020 年 6 月 03 日
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AN96475 describes best practices for improving the electrical fast transient (EFT) immunity of a CapSense system. This application note discusses failures that can occur in a CapSense system during an EFT test and recommends measures that can improve immunity. This application note focuses on considerations for a CapSense system. For a greater insight into EFT and how it affects microcontrollers in general, see AN80994.
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