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AN98549 - Endurance and Retention Management and Validation | 赛普拉斯半导体

AN98549 - Endurance and Retention Management and Validation

最近更新: 
2017 年 7 月 24 日
版本: 
*B
AN98549 provides an introduction to the embedded program/erase operation mechanics and associated side effects. It provides a practical understanding of endurance and deliver guidance for developing appropriate flash subsystem test and validation routines, using Cypress MirrorBit NOR flash as the example.