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PCN170903 | 赛普拉斯半导体

PCN170903

最近更新: 
2020 年 4 月 14 日

Ø Issue Date: 2017 年 3 月 8 日

Ø Effectivity Date: 2017 年 6 月 8 日

Ø Description: Qualification of Texas Instruments’ DMOS6 as a Replacement Wafer Fab Site and Cypress’ Test 25 as an Additional Wafer Sort Site for 64Kb/16Kb/4Kb F-RAM Serial Automotive-grade Products