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PCN172404: Qualification of TI’s DMOS6 as an Additional Wafer Fab Site and Cypress’ Test 25 as an Additional Wafer Sort Site for the 128Kb/256Kb Automotive F-RAM Product Family | 赛普拉斯半导体

PCN172404: Qualification of TI’s DMOS6 as an Additional Wafer Fab Site and Cypress’ Test 25 as an Additional Wafer Sort Site for the 128Kb/256Kb Automotive F-RAM Product Family

最近更新: 
2017 年 10 月 11 日

Issue Date: 2017 年 6 月 18 日

Effectivity Date: 2018 年 4 月 18 日

Qualification of TI’s DMOS6 as an Additional Wafer Fab Site and Cypress’ Test 25 as an Additional Wafer Sort Site for the 128Kb/256Kb Automotive F-RAM Product Family