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PCN173903 | 赛普拉斯半导体

PCN173903

最近更新: 
2020 年 4 月 14 日

Ø Issue Date: 2017 年 10 月 1 日

Ø Effectivity Date: 2017 年 1 月 1 日

Ø Description: Qualification of Texas Instruments’ DMOS 6 as an Additional Wafer Fab Site, Cypress’s Test 25 as an Additional Wafer Sort Site, and Copper-Palladium Wire for Select 512kb/1Mb Serial F-RAM Industrial-Grade Products