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PCN191101 | 赛普拉斯半导体

PCN191101

最近更新: 
2020 年 4 月 14 日

Ø Issue Date: 2019 年 3 月 14 日

Ø Effectivity Date: 2019 年 6 月 14 日

Ø Description: Qualification of Fab 25 with the Copper (Cu) BEOL Process and Test 25 as an Additional Wafer Sort Site for the PSoC® 4200 Product Family