S29GL256S10DHA023 | 赛普拉斯半导体
S29GL256S10DHA023
| 合格汽车 | 是 |
| Density (Mbit) | 256 |
| Initial Access Time (ns) | 100 |
| 接口 | Parallel |
| Interface Frequency (SDR / DDR) (MHz) | NA |
| 最高工作温度 (°C) | 85 |
| 最高工作电压 (V) | 3.60 |
| 最低工作温度 (°C) | -40 |
| 最低工作电压 (V) | 2.70 |
| Operating Voltage (V) | 3 |
| Page Access Time (ns) | 15 |
| Part Family | Parallel NOR |
| Series | GL-S |
| Tape & Reel | 是 |
| Temperature Range (Min C to Max C) | -40C to +85C |
Pricing & Inventory Availability
| 1-9 unit Price* | 10-24 unit Price* | 25-99 unit Price* | 100-249 unit Price* | 250-999 unit Price* | 1000+ unit Price* |
|---|---|---|---|---|---|
| $7.99 | $6.72 | $5.99 | $5.26 | $4.97 | $4.65 |
Packaging/Ordering
Quality and RoHS
Moisture Sensitivity Level (MSL)
3
Peak Reflow Temp. (°C)
260 (Cypress Reflow Profile)
符合有害物质限制 (RoHS) 标准
是
无铅
是
Lead/Ball Finish
无
Marking
技术文档
应用笔记 (25)
2021 年 3 月 03 日
2021 年 3 月 02 日
产品变更通知 (PCN) (2)
2020 年 4 月 14 日
Qualification of XMC as an Additional Wafer Fab Site for Automotive GL-S NOR Flash Memory Products
2020 年 4 月 14 日
Serial Number Addition to Top Mark for Select Flash and SRAM Parts at Cypress Bangkok
Advanced Product Change Notice (APCN) (9)
2020 年 4 月 23 日
Addendum to APCN181801 - Planned Qualification of Tera Probe, Inc. Japan as an Additional Wafer Test (Sort) Site for GL-S Product Family
2020 年 4 月 14 日
Addendum to Advance PCN181801A - Planned Qualification of Tera Probe, Inc. Japan as an Additional Wafer Test (Sort) Site for GL-S Product Family
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