S29GL512S10DHI023 | 赛普拉斯半导体

S29GL512S10DHI023
Status: 生产中

数据手册

(pdf, 2.33 MB) RoHS PB Free

S29GL512S10DHI023

合格汽车
Density (Mbit)512
Initial Access Time (ns)100
接口Parallel
Interface Frequency (SDR / DDR) (MHz)NA
最高工作温度 (°C)85
最高工作电压 (V)3.60
最低工作温度 (°C)-40
最低工作电压 (V)2.70
Operating Voltage (V)3
Page Access Time (ns)15
Part FamilyParallel NOR
SeriesGL-S
Tape & Reel
Temperature Range (Min C to Max C)-40C to +85C

Pricing & Inventory Availability

1-9 unit Price* 10-24 unit Price* 25-99 unit Price* 100-249 unit Price* 250-999 unit Price* 1000+ unit Price*
$9.24 $7.77 $6.93 $6.09 $5.75 $5.38
Availability Quantity Ships In Buy from Cypress Buy from Distributors
Out of Stock 0 Please click here to check lead times

Packaging/Ordering

No. of Pins
64
Package Cross Section Drawing
Package Carrier
REEL
Package Carrier Drawing / Orientation
Standard Pack Quantity
1
Minimum Order Quantity (MOQ)
2200
Order Increment
2200
Estimated Lead Time (days)
126
HTS Code
8542.32.0051
ECCN Suball
3A991.B.1.A

Quality and RoHS

Moisture Sensitivity Level (MSL)
3
Peak Reflow Temp. (°C)
符合有害物质限制 (RoHS) 标准
无铅
Lead/Ball Finish

Device Qualification Reports

FIT/MTBF, ESD (HBM/CDM) and Latch-up data available in the Device Qualification Report.

Last Update: 2017 年 5 月 16 日

技术文档

应用笔记 (25)

2021 年 4 月 05 日

产品变更通知 (PCN) (2)

2020 年 4 月 23 日
Addendum to PCN#165004: Introduction of Die Overcoat for Automotive NOR Flash Memory Products
2020 年 4 月 14 日
Serial Number Addition to Top Mark for Select Flash and SRAM Parts at Cypress Bangkok

Advanced Product Change Notice (APCN) (9)

2020 年 4 月 23 日
Addendum to APCN181801 - Planned Qualification of Tera Probe, Inc. Japan as an Additional Wafer Test (Sort) Site for GL-S Product Family
2020 年 4 月 14 日
Q419 Horizon Report Update
2020 年 4 月 14 日
Q419 Automotive Horizon Report Update
2020 年 4 月 14 日
Q319 Horizon Report Update
2020 年 4 月 14 日
Q319 Automotive Horizon Report Update
2020 年 4 月 14 日
2019 Horizon Report: Q2 Update
2020 年 4 月 14 日
2019 Automotive Horizon Report: Q2 Update
2020 年 4 月 14 日
Addendum to Advance PCN181801A - Planned Qualification of Tera Probe, Inc. Japan as an Additional Wafer Test (Sort) Site for GL-S Product Family
2020 年 4 月 14 日
2019 Annual Automotive Horizon Report